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Title:
System-on-Chip Test Architectures
( Full text )
ISBN:
978-0-12-373973-5
eISBN:
978-1-281-10004-7
Authors:
Stroud, Charles E.; Touba, Nur A.; Wang, Laung-Terng; ; Laung-Terng Wang; Charles E. Stroud
Imprint:
Morgan Kaufmann, 2008
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