Contains information about title and source of a journal
Naslov:
Addressable failure site test structures (AFS-TS) for process development and optimization
Vir:
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)
Doong,
K.Y.-Y.
l. 2000,
str. 51
-56