Contains information about title and source of a journal
Naslov:
Defect tolerant zero-bias topological photocurrent in a ferroelectric semiconductor
Vir:
Proceedings of the National Academy of Sciences of the United States of America
[0027-8424]
Hatada,
Hiroki
l. 2020,
letn. 117,
št. 34,
str. 20411
-20415