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![](https://beacon01.alma.exlibrisgroup.com/boom/apache_pb.gif?SRVR=adz.izum.si&IP=193.2.126.232&A=SFX&P=SFXMenu&S=s082205FC-4E99-11EF-8A0A-CDCE84CE164B&I=39IZM&T=&OP=Display&O=html&O1=14171211&O2=4920000000250678&O3=&O4=summon.serialssolutions.com&O5=https%3A%2F%2Fadz.izum.si%2Fsfxlcl41%3Fctx_enc%3Dinfo%253Aofi%252Fenc%253AUTF-8%26ctx_ver%3DZ39.88-2004%26rfr_id%3Dinfo%253Asid%252Fsummon.serialssolutions.com%26rft.atitle%3DHow%2520to%2520Explain%2520a%2520Patch%253A%2520An%2520Empirical%2520Study%2520of%2520Patch%2520Explanations%2520in%2520Open%2520Source%2520Projects%26rft.au%3DChen%252C%2520Junjie%26rft.au%3DHou%252C%2520Yaozong%26rft.au%3DLiang%252C%2520Jingjing%26rft.au%3DZhou%252C%2520Shurui%26rft.date%3D2019-10-01%26rft.eissn%3D2332-6549%26rft.epage%3D69%26rft.externalDocID%3D8987552%26rft.genre%3Dproceeding%26rft.pub%3DIEEE%26rft.spage%3D58%26rft.title%3D2019%2520IEEE%252030th%2520International%2520Symposium%2520on%2520Software%2520Reliability%2520Engineering%2520%2528ISSRE%2529%26rft_id%3Dinfo%253Adoi%252F10.1109%252FISSRE.2019.00016%26rft_val_fmt%3Dinfo%253Aofi%252Ffmt%253Akev%253Amtx%253Ajournal&O6=1-IEEE_ELECTRONIC_LIBRARY_IEL_UL_LCL-getFullTxt-object,2-IEEE_ELECTRONIC_LIBRARY_IEL_UM_LCL-getFullTxt-object,3-IEEE_ELECTRONIC_LIBRARY_IEL_CONFERENCE_PROCEEDINGS_UL_LCL-getFullTxt-object,4-IEEE_ELECTRONIC_LIBRARY_IEL_CONFERENCE_PROCEEDINGS_UM_LCL-getFullTxt-object,5-DOI-getDOI-object,6-COBIB_SI_LCL-getHolding-object,7-AMAZON_FREE-getBookReview-object,8-REFWORKS_EXPORT_TOOL-getReference-object,9-GOOGLE_BOOK_SEARCH-getWebSearch-object,10-GOOGLE_SCHOLAR_FREE-getWebSearch-object,11-WWW_SEARCH_ENGINES_FREE-getWebSearch-object&O7=1.974071&O8=N&O9=<ctx:context-object identifier="urn:sfxstat:14171211-s082205FC-4E99-11EF-8A0A-CDCE84CE164B" timestamp="2024-07-30T19:27:45Z" xmlns:ctx="info:ofi/fmt:xml:xsd:ctx">
<ctx:referent>
<ctx:identifier>urn:sfxid:4920000000250678</ctx:identifier>
<ctx:metadata-by-val>
<ctx:format>info:ofi/fmt:xml:xsd:journal</ctx:format>
<ctx:metadata>
<jnl:journal xmlns:jnl="info:ofi/fmt:xml:xsd:journal">
<jnl:atitle>How to Explain a Patch: An Empirical Study of Patch Explanations in Open Source Projects</jnl:atitle>
<jnl:jtitle>2019 IEEE 30th International Symposium on Software Reliability Engineering (ISSRE)</jnl:jtitle>
<jnl:date>2019-10-00</jnl:date>
<jnl:spage>58</jnl:spage>
<jnl:epage>69</jnl:epage>
<jnl:genre>proceeding</jnl:genre>
<jnl:eissn>2332-6549</jnl:eissn>
<jnl:language>eng</jnl:language>
<jnl:authors></jnl:authors>
</jnl:journal>
</ctx:metadata>
</ctx:metadata-by-val>
</ctx:referent>
<ctx:requester>
<ctx:identifier>urn:ip:97003b4541490a304677e31bf011f5293dcbfe77</ctx:identifier>
<ctx:identifier>urn:UUID:s082205FC-4E99-11EF-8A0A-CDCE84CE164B</ctx:identifier>
</ctx:requester>
<ctx:referrer>
<ctx:identifier>info:sid/summon.serialssolutions.com</ctx:identifier>
</ctx:referrer>
<ctx:service-type>
<ctx:metadata-by-val>
<ctx:format>info:ofi/fmt:xml:xsd:svcList</ctx:format>
<ctx:metadata>
<svc:svcList xmlns:svc="http://www.exlibrisgroup.com/schema/info:ofi/fmt:xml:xsd:sch_svc"></svc:svcList>
</ctx:metadata>
</ctx:metadata-by-val>
</ctx:service-type>
<ctx:resolver>
<ctx:identifier>https://adz.izum.si/sfxlcl41</ctx:identifier>
</ctx:resolver>
</ctx:context-object>
&)