Contains information about title and source of a journal
Naslov:
MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter
Vir:
Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms
[0168-583X]
Stoytschew,
Valentin
l. 2016,
letn. 371,
str. 194
-198