Contains information about title and source of a journal
Naslov:
Migration from an AlGaAs to an InGaP emitter HBT IC process for improved reliability
Vir:
GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 20th Annual. Technical Digest 1998 (Cat. No.98CH36260)
[1064-7775]
Low,
T S
l. 1998,
str. 153
-156