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![](https://beacon01.alma.exlibrisgroup.com/boom/apache_pb.gif?SRVR=adz.izum.si&IP=193.2.126.232&A=SFX&P=SFXMenu&S=sF428292E-386C-11EF-9149-096D85CE164B&I=39IZM&T=&OP=Display&O=html&O1=12674115&O2=1000000000791808&O3=&O4=summon.serialssolutions.com&O5=https%3A%2F%2Fadz.izum.si%2Fsfxlcl41%3Fctx_enc%3Dinfo%253Aofi%252Fenc%253AUTF-8%26ctx_ver%3DZ39.88-2004%26rfr_id%3Dinfo%253Asid%252Fsummon.serialssolutions.com%26rft.atitle%3DNiobium%2520Contamination%2520in%2520Silicon%26rft.au%3DBonoli%252C%2520Francesco%26rft.au%3DBorionetti%252C%2520Gabriella%26rft.au%3DCodegoni%252C%2520Davide%26rft.au%3DPolignano%252C%2520Maria%2520Luisa%26rft.date%3D2010-07-08%26rft.eissn%3D2151-2043%26rft.epage%3D1566%26rft.externalDBID%3Dn%252Fa%26rft.externalDocID%3D10_1149_MA2010_02_23_1566%26rft.genre%3Darticle%26rft.issn%3D2151-2043%26rft.issue%3D23%26rft.jtitle%3DMeeting%2520abstracts%2520%2528Electrochemical%2520Society%2529%26rft.spage%3D1566%26rft.volume%3DMA2010-02%26rft_id%3Dinfo%253Adoi%252F10.1149%252FMA2010-02%252F23%252F1566%26rft_val_fmt%3Dinfo%253Aofi%252Ffmt%253Akev%253Amtx%253Ajournal&O6=1-FREE_FULL_TEXT_JOURNALS_IN_CHEMISTRY-getFullTxt-object,2-COBIB_SI_LCL-getHolding-object,3-DOI-getDOI-object,4-REFWORKS_EXPORT_TOOL-getReference-object,5-GOOGLE_SCHOLAR_FREE-getWebSearch-object,6-WWW_SEARCH_ENGINES_FREE-getWebSearch-object&O7=1.530514&O8=N&O9=<ctx:context-object identifier="urn:sfxstat:12674115-sF428292E-386C-11EF-9149-096D85CE164B" timestamp="2024-07-02T14:16:48Z" xmlns:ctx="info:ofi/fmt:xml:xsd:ctx">
<ctx:referent>
<ctx:identifier>urn:sfxid:1000000000791808</ctx:identifier>
<ctx:metadata-by-val>
<ctx:format>info:ofi/fmt:xml:xsd:journal</ctx:format>
<ctx:metadata>
<jnl:journal xmlns:jnl="info:ofi/fmt:xml:xsd:journal">
<jnl:atitle>Niobium Contamination in Silicon</jnl:atitle>
<jnl:jtitle>Meeting abstracts</jnl:jtitle>
<jnl:date>2010-07-08</jnl:date>
<jnl:spage>1566</jnl:spage>
<jnl:epage>1566</jnl:epage>
<jnl:issn>2151-2043</jnl:issn>
<jnl:volume>MA2010-02</jnl:volume>
<jnl:issue>23</jnl:issue>
<jnl:genre>article</jnl:genre>
<jnl:eissn>2151-2043</jnl:eissn>
<jnl:language>eng</jnl:language>
<jnl:authors></jnl:authors>
</jnl:journal>
</ctx:metadata>
</ctx:metadata-by-val>
</ctx:referent>
<ctx:requester>
<ctx:identifier>urn:ip:31d1d105d9d4edbaa507633707a760401a3ad721</ctx:identifier>
<ctx:identifier>urn:UUID:sF428292E-386C-11EF-9149-096D85CE164B</ctx:identifier>
</ctx:requester>
<ctx:referrer>
<ctx:identifier>info:sid/summon.serialssolutions.com</ctx:identifier>
</ctx:referrer>
<ctx:service-type>
<ctx:metadata-by-val>
<ctx:format>info:ofi/fmt:xml:xsd:svcList</ctx:format>
<ctx:metadata>
<svc:svcList xmlns:svc="http://www.exlibrisgroup.com/schema/info:ofi/fmt:xml:xsd:sch_svc"></svc:svcList>
</ctx:metadata>
</ctx:metadata-by-val>
</ctx:service-type>
<ctx:resolver>
<ctx:identifier>https://adz.izum.si/sfxlcl41</ctx:identifier>
</ctx:resolver>
</ctx:context-object>
&)