Contains information about title and source of a journal
Naslov:
Probing and irradiation tests of ALICE pixel chip wafers and sensors
Vir:
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)
[1091-5281]
Antinori,
F
l. 2004,
letn. 3,
str. 1823