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![](https://beacon01.alma.exlibrisgroup.com/boom/apache_pb.gif?SRVR=adz.izum.si&IP=193.2.126.232&A=SFX&P=SFXMenu&S=sE572A566-5861-11EF-B50C-3F0F85CE164B&I=39IZM&T=&OP=Display&O=html&O1=14869114&O2=2560000000337310&O3=&O4=summon.serialssolutions.com&O5=https%3A%2F%2Fadz.izum.si%2Fsfxlcl41%3Fctx_enc%3Dinfo%253Aofi%252Fenc%253AUTF-8%26ctx_ver%3DZ39.88-2004%26rfr_id%3Dinfo%253Asid%252Fsummon.serialssolutions.com%26rft.atitle%3DReRAM-based%25204T2R%2520nonvolatile%2520TCAM%2520with%25207x%2520NVM-stress%2520reduction%252C%2520and%25204x%2520improvement%2520in%2520speed-wordlength-capacity%2520for%2520normally-off%2520instant-on%2520filter-based%2520search%2520engines%2520used%2520in%2520big-data%2520processing%26rft.au%3DChia-Chen%2520Kuo%26rft.au%3DChing-Hao%2520Chuang%26rft.au%3DLi-Yue%2520Huang%26rft.au%3DMeng-Fan%2520Chang%26rft.date%3D2014-06-01%26rft.eissn%3D2158-5636%26rft.epage%3D2%26rft.externalDocID%3D6858404%26rft.genre%3Dproceeding%26rft.isbn%3D9781479933273%26rft.issn%3D2158-5601%26rft.pub%3DIEEE%26rft.spage%3D1%26rft.title%3D2014%2520Symposium%2520on%2520VLSI%2520Circuits%2520Digest%2520of%2520Technical%2520Papers%26rft_id%3Dinfo%253Adoi%252F10.1109%252FVLSIC.2014.6858404%26rft_val_fmt%3Dinfo%253Aofi%252Ffmt%253Akev%253Amtx%253Abook&O6=1-IEEE_ELECTRONIC_LIBRARY_IEL_UL_LCL-getFullTxt-object,2-IEEE_ELECTRONIC_LIBRARY_IEL_UM_LCL-getFullTxt-object,3-IEEE_IET_ELECTRONIC_LIBRARY_IEL-getFullTxt-object,4-IEEE_ELECTRONIC_LIBRARY_IEL_CONFERENCE_PROCEEDINGS_UL_LCL-getFullTxt-object,5-IEEE_ELECTRONIC_LIBRARY_IEL_CONFERENCE_PROCEEDINGS_UM_LCL-getFullTxt-object,6-DOI-getDOI-object,7-COBIB_SI_LCL-getHolding-object,8-AMAZON_FREE-getBookReview-object,9-REFWORKS_EXPORT_TOOL-getReference-object,10-GOOGLE_BOOK_SEARCH-getWebSearch-object,11-GOOGLE_SCHOLAR_FREE-getWebSearch-object,12-WWW_SEARCH_ENGINES_FREE-getWebSearch-object&O7=2.174119&O8=N&O9=<ctx:context-object identifier="urn:sfxstat:14869114-sE572A566-5861-11EF-B50C-3F0F85CE164B" timestamp="2024-08-12T06:18:21Z" xmlns:ctx="info:ofi/fmt:xml:xsd:ctx">
<ctx:referent>
<ctx:identifier>urn:sfxid:2560000000337310</ctx:identifier>
<ctx:metadata-by-val>
<ctx:format>info:ofi/fmt:xml:xsd:journal</ctx:format>
<ctx:metadata>
<jnl:journal xmlns:jnl="info:ofi/fmt:xml:xsd:journal">
<jnl:atitle>ReRAM-based 4T2R nonvolatile TCAM with 7x NVM-stress reduction, and 4x improvement in speed-wordlength-capacity for normally-off instant-on filter-based search engines used in big-data processing</jnl:atitle>
<jnl:jtitle>2014 Symposium on VLSI Circuits Digest of Technical Papers</jnl:jtitle>
<jnl:date>2014-06-00</jnl:date>
<jnl:spage>1</jnl:spage>
<jnl:epage>2</jnl:epage>
<jnl:issn>2158-5601</jnl:issn>
<jnl:genre>proceeding</jnl:genre>
<jnl:eissn>2158-5636</jnl:eissn>
<jnl:language>eng</jnl:language>
<jnl:authors></jnl:authors>
</jnl:journal>
</ctx:metadata>
</ctx:metadata-by-val>
</ctx:referent>
<ctx:requester>
<ctx:identifier>urn:ip:0fddcb818af4a96fa72eed081267ffaf5cadf9fb</ctx:identifier>
<ctx:identifier>urn:UUID:sE572A566-5861-11EF-B50C-3F0F85CE164B</ctx:identifier>
</ctx:requester>
<ctx:referrer>
<ctx:identifier>info:sid/summon.serialssolutions.com</ctx:identifier>
</ctx:referrer>
<ctx:service-type>
<ctx:metadata-by-val>
<ctx:format>info:ofi/fmt:xml:xsd:svcList</ctx:format>
<ctx:metadata>
<svc:svcList xmlns:svc="http://www.exlibrisgroup.com/schema/info:ofi/fmt:xml:xsd:sch_svc"></svc:svcList>
</ctx:metadata>
</ctx:metadata-by-val>
</ctx:service-type>
<ctx:resolver>
<ctx:identifier>https://adz.izum.si/sfxlcl41</ctx:identifier>
</ctx:resolver>
</ctx:context-object>
&)