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![](https://beacon01.alma.exlibrisgroup.com/boom/apache_pb.gif?SRVR=adz.izum.si&IP=193.2.126.232&A=SFX&P=SFXMenu&S=sD125D74E-5AD8-11EF-A2D5-F91685CE164B&I=39IZM&T=&OP=Display&O=html&O1=15196741&O2=111055184255724&O3=&O4=summon.serialssolutions.com&O5=https%3A%2F%2Fadz.izum.si%2Fsfxlcl41%3Fctx_enc%3Dinfo%253Aofi%252Fenc%253AUTF-8%26ctx_ver%3DZ39.88-2004%26rfr_id%3Dinfo%253Asid%252Fsummon.serialssolutions.com%26rft.atitle%3DReliability%2520of%2520InGaP%2520emitter%2520HBTs%2520at%2520high%2520collector%2520voltage%26rft.au%3DBonse%252C%2520M.%26rft.au%3DChandler%252C%2520P.%26rft.au%3DCulver%252C%2520M.%26rft.au%3DYeats%252C%2520B.%26rft.date%3D2002-01-01%26rft.eissn%3D2379-5638%26rft.epage%3D76%26rft.externalDocID%3D1049032%26rft.genre%3Dproceeding%26rft.isbn%3D9780780374478%26rft.issn%3D1064-7775%26rft.pub%3DIEEE%26rft.spage%3D73%26rft.title%3D24th%2520Annual%2520Technical%2520Digest%2520Gallium%2520Arsenide%2520Integrated%2520Circuit%2520%2528GaAs%2520IC%2529%2520Symposiu%26rft_id%3Dinfo%253Adoi%252F10.1109%252FGAAS.2002.1049032%26rft_val_fmt%3Dinfo%253Aofi%252Ffmt%253Akev%253Amtx%253Abook&O6=1-IEEE_ELECTRONIC_LIBRARY_IEL_UL_LCL-getFullTxt-object,2-IEEE_ELECTRONIC_LIBRARY_IEL_UM_LCL-getFullTxt-object,3-IEEE_IET_ELECTRONIC_LIBRARY_IEL-getFullTxt-object,4-IEEE_ELECTRONIC_LIBRARY_IEL_CONFERENCE_PROCEEDINGS-getFullTxt-object,5-IEEE_ELECTRONIC_LIBRARY_IEL_CONFERENCE_PROCEEDINGS_UL_LCL-getFullTxt-object,6-IEEE_ELECTRONIC_LIBRARY_IEL_CONFERENCE_PROCEEDINGS_UM_LCL-getFullTxt-object,7-DOI-getDOI-object,8-COBIB_SI_LCL-getHolding-object,9-AMAZON_FREE-getBookReview-object,10-REFWORKS_EXPORT_TOOL-getReference-object,11-GOOGLE_BOOK_SEARCH-getWebSearch-object,12-GOOGLE_SCHOLAR_FREE-getWebSearch-object,13-WWW_SEARCH_ENGINES_FREE-getWebSearch-object&O7=1.038148&O8=N&O9=<ctx:context-object identifier="urn:sfxstat:15196741-sD125D74E-5AD8-11EF-A2D5-F91685CE164B" timestamp="2024-08-15T09:34:48Z" xmlns:ctx="info:ofi/fmt:xml:xsd:ctx">
<ctx:referent>
<ctx:identifier>urn:sfxid:111055184255724</ctx:identifier>
<ctx:metadata-by-val>
<ctx:format>info:ofi/fmt:xml:xsd:journal</ctx:format>
<ctx:metadata>
<jnl:journal xmlns:jnl="info:ofi/fmt:xml:xsd:journal">
<jnl:atitle>Reliability of InGaP emitter HBTs at high collector voltage</jnl:atitle>
<jnl:jtitle>24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu</jnl:jtitle>
<jnl:date>2002-00-00</jnl:date>
<jnl:spage>73</jnl:spage>
<jnl:epage>76</jnl:epage>
<jnl:issn>1064-7775</jnl:issn>
<jnl:genre>proceeding</jnl:genre>
<jnl:eissn>2379-5638</jnl:eissn>
<jnl:language>eng</jnl:language>
<jnl:authors></jnl:authors>
</jnl:journal>
</ctx:metadata>
</ctx:metadata-by-val>
</ctx:referent>
<ctx:requester>
<ctx:identifier>urn:ip:e3793a5d03313f6198b2ddcbf727d9f948af077a</ctx:identifier>
<ctx:identifier>urn:UUID:sD125D74E-5AD8-11EF-A2D5-F91685CE164B</ctx:identifier>
</ctx:requester>
<ctx:referrer>
<ctx:identifier>info:sid/summon.serialssolutions.com</ctx:identifier>
</ctx:referrer>
<ctx:service-type>
<ctx:metadata-by-val>
<ctx:format>info:ofi/fmt:xml:xsd:svcList</ctx:format>
<ctx:metadata>
<svc:svcList xmlns:svc="http://www.exlibrisgroup.com/schema/info:ofi/fmt:xml:xsd:sch_svc"></svc:svcList>
</ctx:metadata>
</ctx:metadata-by-val>
</ctx:service-type>
<ctx:resolver>
<ctx:identifier>https://adz.izum.si/sfxlcl41</ctx:identifier>
</ctx:resolver>
</ctx:context-object>
&)