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![](https://beacon01.alma.exlibrisgroup.com/boom/apache_pb.gif?SRVR=adz.izum.si&IP=193.2.126.232&A=SFX&P=SFXMenu&S=s04F37B26-0354-11EF-9798-E03285CE164B&I=39IZM&T=&OP=Display&O=html&O1=11924094&O2=954925609918&O3=&O4=doi&O5=https%3A%2F%2Fadz.izum.si%2Fsfxlcl41%3Furl_ver%3DZ39.88-2004%26url_ctx_fmt%3Dinfo%253Aofi%253Afmt%253Akev%253Amtx%253Actx%26ctx_ver%3DZ39.88-2004%26ctx_enc%3Dinfo%253Aofi%252Fenc%253AUTF-8%26rft_val_fmt%3Dinfo%253Aofi%253Afmt%253Akev%253Amtx%253Ajournal%26rft_id%3Dinfo%253Adoi%252F10.1364%252FOE.25.030686%26rft.date%3D2017%26rft.volume%3D25%26rft.issn%3D1094-4087%26rft.issue%3D24%26rft.epage%3D30695%26rft.chron%3DNov.%25202017%26rft.genre%3Darticle%26rft.sici%3D5537531%26rft.spage%3D30686%26rft.atitle%3DHigh%2520resolution%2520beam%2520profiling%2520of%2520X-ray%2520free%2520electron%2520laser%2520radiation%2520by%2520polymer%2520imprint%2520development%26rfr_id%3DCOBISS_OPAC%26sfx.ignore_date_threshold%3D1&O6=1-UNPAYWALL-getFullTxt-object,2-DOAJ_DIRECTORY_OPEN_ACCESS_JOURNALS-getFullTxt-object,3-EZB-FREE-00999_FREELY_AVAILABLE_EZB_JOURNALS-getFullTxt-object,4-MISCELLANEOUS_FREE_EJOURNALS-getFullTxt-object,5-GFMER_FREE_MEDICAL_JOURNALS-getFullTxt-object,6-COBIB_SI_LCL-getHolding-object,7-DOI-getDOI-object,8-ELSEVIER_SCOPUS_FIS_LCL-getAbstract-object,9-ISI_WEB_OF_SCIENCE-getAuthor-object,10-ISI_JOURNAL_CITATION_REPORTS_SCIENCE_EDITION-getCitedJournal-object,11-REFWORKS_EXPORT_TOOL-getReference-object,12-SHERPA_RoMEO_LCL-getWebService-object,13-GOOGLE_SCHOLAR_FREE-getWebSearch-object,14-WWW_SEARCH_ENGINES_FREE-getWebSearch-object&O7=1.514263&O8=N&O9=<ctx:context-object identifier="urn:sfxstat:11924094-s04F37B26-0354-11EF-9798-E03285CE164B" timestamp="2024-04-26T00:34:47Z" xmlns:ctx="info:ofi/fmt:xml:xsd:ctx">
<ctx:referent>
<ctx:identifier>urn:sfxid:954925609918</ctx:identifier>
<ctx:metadata-by-val>
<ctx:format>info:ofi/fmt:xml:xsd:journal</ctx:format>
<ctx:metadata>
<jnl:journal xmlns:jnl="info:ofi/fmt:xml:xsd:journal">
<jnl:atitle>High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development</jnl:atitle>
<jnl:jtitle>Optics Express</jnl:jtitle>
<jnl:date>2017-11-27</jnl:date>
<jnl:spage>30686</jnl:spage>
<jnl:epage>30695</jnl:epage>
<jnl:coden>OPEXFF</jnl:coden>
<jnl:sici>5537531</jnl:sici>
<jnl:issn>1094-4087</jnl:issn>
<jnl:volume>25</jnl:volume>
<jnl:issue>24</jnl:issue>
<jnl:chron>Nov. 2017</jnl:chron>
<jnl:genre>article</jnl:genre>
<jnl:eissn>1094-4087</jnl:eissn>
<jnl:language>eng</jnl:language>
<jnl:coden>OPEXFF</jnl:coden>
<jnl:authors></jnl:authors>
</jnl:journal>
</ctx:metadata>
</ctx:metadata-by-val>
</ctx:referent>
<ctx:requester>
<ctx:identifier>urn:ip:62ea7ecd46aadaff81fb712a6118bae96132e5fb</ctx:identifier>
<ctx:identifier>urn:UUID:s04F37B26-0354-11EF-9798-E03285CE164B</ctx:identifier>
</ctx:requester>
<ctx:referrer>
<ctx:identifier>COBISS_OPAC</ctx:identifier>
</ctx:referrer>
<ctx:service-type>
<ctx:metadata-by-val>
<ctx:format>info:ofi/fmt:xml:xsd:svcList</ctx:format>
<ctx:metadata>
<svc:svcList xmlns:svc="http://www.exlibrisgroup.com/schema/info:ofi/fmt:xml:xsd:sch_svc"></svc:svcList>
</ctx:metadata>
</ctx:metadata-by-val>
</ctx:service-type>
<ctx:resolver>
<ctx:identifier>https://adz.izum.si/sfxlcl41</ctx:identifier>
</ctx:resolver>
</ctx:context-object>
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